Cite
GaN nanowires as probes for high resolution atomic force and scanning tunneling microscopy.
MLA
Yngman, S., et al. “GaN Nanowires as Probes for High Resolution Atomic Force and Scanning Tunneling Microscopy.” Review of Scientific Instruments, vol. 90, no. 10, Oct. 2019, p. N.PAG. EBSCOhost, https://doi.org/10.1063/1.5122791.
APA
Yngman, S., Lenrick, F., Liu, Y.-P., Ren, Z., Khalilian, M., Ohlsson, B. J., Hessman, D., Samuelson, L., Timm, R., & Mikkelsen, A. (2019). GaN nanowires as probes for high resolution atomic force and scanning tunneling microscopy. Review of Scientific Instruments, 90(10), N.PAG. https://doi.org/10.1063/1.5122791
Chicago
Yngman, S., F. Lenrick, Y.-P. Liu, Z. Ren, M. Khalilian, B. J. Ohlsson, D. Hessman, L. Samuelson, R. Timm, and A. Mikkelsen. 2019. “GaN Nanowires as Probes for High Resolution Atomic Force and Scanning Tunneling Microscopy.” Review of Scientific Instruments 90 (10): N.PAG. doi:10.1063/1.5122791.