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LSTM-RNN-based defect classification in honeycomb structures using infrared thermography.

Authors :
Hu, Caiqi
Duan, Yuxia
Liu, Shicai
Yan, Yiqian
Tao, Ning
Osman, Ahmad
Ibarra-Castanedo, Clemente
Sfarra, Stefano
Chen, Dapeng
Zhang, Cunlin
Source :
Infrared Physics & Technology. Nov2019, Vol. 102, pN.PAG-N.PAG. 1p.
Publication Year :
2019

Abstract

• Reports on the use of LSTM-RNN model to automatically classify four kinds of common defects and non-defective areas in honeycomb materials. • The proposed LSTM-RNN model had a greater than 90% sensitivity in classifying water and hydraulic oil ingress. • The trained LSTM-RNN model identified the non-artificial designed adhesive pooling defects which were produced in the manufacturing process. Honeycomb-structured materials are widely used in commercial and military aircraft. Manufacturing defects and damage during operation have become primary safety threats. This has increased the demand for non-destructive testing (NDT) for damage and flaws during aircraft operation and maintenance. Characterizing, or classifying defects, in addition to detecting them, is important. Classifying the liquids trapped in aircraft honeycomb cells is an example. A small amount of ingressed water is often tolerable, whereas a small amount of hydraulic oil may be an early warning of hydraulic system malfunction. This paper proposes an infrared thermography-based NDT technique and a long short term memory recurrent neural network (LSTM-RNN) model which automatically classifies common defects occurring in honeycomb materials. These including debonding, adhesive pooling, and liquid ingress. This LSTM-based algorithm has a greater than 90% sensitivity in classifying water, and hydraulic oil ingress. It has a greater than 70% sensitivity in classifying debonding and adhesive pooling. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
13504495
Volume :
102
Database :
Academic Search Index
Journal :
Infrared Physics & Technology
Publication Type :
Academic Journal
Accession number :
139347492
Full Text :
https://doi.org/10.1016/j.infrared.2019.103032