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A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production.

Authors :
Tu, K. N.
Gusak, A. M.
Source :
Journal of Applied Physics. 8/21/2019, Vol. 126 Issue 7, pN.PAG-N.PAG. 6p.
Publication Year :
2019

Abstract

We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00218979
Volume :
126
Issue :
7
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
138173710
Full Text :
https://doi.org/10.1063/1.5111159