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A unified model of mean-time-to-failure for electromigration, thermomigration, and stress-migration based on entropy production.
- Source :
-
Journal of Applied Physics . 8/21/2019, Vol. 126 Issue 7, pN.PAG-N.PAG. 6p. - Publication Year :
- 2019
-
Abstract
- We have revisited Black's equation of mean-time-to-failure (MTTF) for electromigration from the viewpoint that in irreversible processes, entropy production is the controlling behavior. We justify that the power factor on current density is n = 2, as given in the original Black's equation. Furthermore, on the basis of entropy production, we provide a unified model of MTTF for thermomigration and stress-migration. We note that up to now, no MTTF for thermomigration and stress-migration is given. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 126
- Issue :
- 7
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 138173710
- Full Text :
- https://doi.org/10.1063/1.5111159