Cite
Nano-Intrinsic True Random Number Generation: A Device to Data Study.
MLA
Kim, Jeeson, et al. “Nano-Intrinsic True Random Number Generation: A Device to Data Study.” IEEE Transactions on Circuits & Systems. Part I: Regular Papers, vol. 66, no. 7, July 2019, pp. 2615–26. EBSCOhost, https://doi.org/10.1109/TCSI.2019.2895045.
APA
Kim, J., Nili, H., Truong, N. D., Ahmed, T., Yang, J., Jeong, D. S., Sriram, S., Ranasinghe, D. C., Ippolito, S., Chun, H., & Kavehei, O. (2019). Nano-Intrinsic True Random Number Generation: A Device to Data Study. IEEE Transactions on Circuits & Systems. Part I: Regular Papers, 66(7), 2615–2626. https://doi.org/10.1109/TCSI.2019.2895045
Chicago
Kim, Jeeson, Hussein Nili, Nhan Duy Truong, Taimur Ahmed, Jiawei Yang, Doo Seok Jeong, Sharath Sriram, et al. 2019. “Nano-Intrinsic True Random Number Generation: A Device to Data Study.” IEEE Transactions on Circuits & Systems. Part I: Regular Papers 66 (7): 2615–26. doi:10.1109/TCSI.2019.2895045.