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Preparation and characterization of bright high quality YAG: Eu3+ thin films grown by sol–gel dip-coating technique.

Authors :
Boukerika, A.
Guerbous, L.
Chelef, H.
Benharrat, L.
Source :
Thin Solid Films. Aug2019, Vol. 683, p74-81. 8p.
Publication Year :
2019

Abstract

In the present study, highly transparent thin films of europium trivalent (Eu3+) -doped yttrium aluminum garnet (YAG: Eu3+), deposited on quartz substrates with good optical properties were successfully prepared by sol–gel dip-coating technique. Thin film thicknesses were incremented by increasing the number of coated layers. The relationship between the film thickness and its structural and optical properties were highlighted. Prepared thin film samples were characterized by Rutherford Backscattering Spectroscopy (RBS), X-ray diffraction (XRD), field emission scanning electron microscopy (FE-SEM), photoluminescence spectroscopy (PL) and UV–Visible spectroscopy. RBS analysis shows that the film thicknesses range from 74 nm to 803 nm. According to XRD results, the single cubic phase of YAG was formed and no impurity phases appeared. Also, the crystallite size increased with the increase of film thickness. FE-SEM images reveal spherical shape particles with the formation of cracks. All samples present a dominate and intense orange emission centered at 594 nm characteristic of magnetic dipole 5D 0 →7F 1 transition of Eu3+ ion in the YAG host material. Also, it was found that the emission intensity increases with increasing film thickness and correlated with its density. The UV–Vis spectroscopy revealed that the films were transparent and the degree of transparency depends on the film thickness. • YAG: Eu3+ orange phosphors were successfully prepared by sol-gel dip-coating. • Increasing film thickness improves film density, grain size and crystallinity. • Highly transparent (>80%) films could be obtained with thicknesses up to 380 nm. • Incrementing film thickness enhances both excitation and emission intensities. • Dominating and intense orange emission is observed in all samples. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00406090
Volume :
683
Database :
Academic Search Index
Journal :
Thin Solid Films
Publication Type :
Academic Journal
Accession number :
136768263
Full Text :
https://doi.org/10.1016/j.tsf.2019.05.017