XPS and ToF-SIMS characterization of the surface oxides on lean duplex stainless steel – Global and local approaches.

• Surface oxide layers formed on 2304 duplex stainless steel are investigated. • The native surface and the passivated surface are compared. • An innovative coupling of XPS and ToF-SIMS is used. • The oxide layers formed on austenite and ferrite phases are locally characterized. • The effect of passivation on the surface oxide layer is discussed. This work reports an innovative methodology based on the coupling of XPS and ToF-SIMS in order to study the surface oxide layer formed on austenite and ferrite phases of duplex stainless steels. The native oxide film obtained after mechanical polishing and the passive film obtained after electrochemical passivation in 0.05 M H 2 SO 4 were investigated. Chromium and molybdenum contents were found to be higher in the oxide layer formed on ferrite phase. Nickel and nitrogen enrichments were found to be more pronounced under the oxide layer formed on austenite phase. The effect of passivation on the surface oxide layer is discussed. [ABSTRACT FROM AUTHOR]