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43- and 50-Mp High-Performance Interline CCD Image Sensors.

Authors :
Wang, Shen
Brolly, Richard
Carpenter, Douglas A.
DeJager, Adam
Doran, James E.
Fabinski, Robert P.
Frank, Tom
Kather, Ryan
Kosman, Stephen
Lum, Alden
McCarten, John
Meisenzahl, Eric J.
Mersich, Peter
Stevens, Eric
Summa, Joseph
Tivarus, Cristian
Tobey, Brian
Source :
IEEE Transactions on Electron Devices. Mar2019, Vol. 66 Issue 3, p1329-1337. 9p.
Publication Year :
2019

Abstract

This paper describes the design and performance of two new high-resolution interline charge-coupled device image sensors for use in industrial, machine vision, and aerial photography applications. These sensors feature 4.5- $\mu \text{m}$ pixels, 4 outputs, fast dump gate, horizontal lateral overflow drain, and vertical electronic shutter. The 43-Mp sensor has a 35-mm optical format and the 50-Mp sensor has a larger format with a 2.175:1 aspect ratio that matches many modern mobile phone displays. This paper discusses the challenges and solutions to manufacture such large sensors with superior image quality such as uniformity, read noise, dark current, smear, transfer gate blooming, lag, and so on. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189383
Volume :
66
Issue :
3
Database :
Academic Search Index
Journal :
IEEE Transactions on Electron Devices
Publication Type :
Academic Journal
Accession number :
136509734
Full Text :
https://doi.org/10.1109/TED.2019.2891414