Reliability based hardware Trojan design using physics-based electromigration models.

MLA

Cook, Chase, et al. “Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models.” Integration: The VLSI Journal, vol. 66, May 2019, pp. 9–15. EBSCOhost, https://doi.org/10.1016/j.vlsi.2019.01.011.

APA

Cook, C., Sadiqbatcha, S., Sun, Z., & Tan, S. X.-D. (2019). Reliability based hardware Trojan design using physics-based electromigration models. Integration: The VLSI Journal, 66, 9–15. https://doi.org/10.1016/j.vlsi.2019.01.011

Chicago

Cook, Chase, Sheriff Sadiqbatcha, Zeyu Sun, and Sheldon X.-D. Tan. 2019. “Reliability Based Hardware Trojan Design Using Physics-Based Electromigration Models.” Integration: The VLSI Journal 66 (May): 9–15. doi:10.1016/j.vlsi.2019.01.011.