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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdays.

Authors :
Dunin-Borkowski, Rafal E.
Mayer, Joachim
Sachse, Carsten
Tillmann, Karsten
Source :
Ultramicroscopy. Aug2019, Vol. 203, p1-1. 1p.
Publication Year :
2019

Details

Language :
English
ISSN :
03043991
Volume :
203
Database :
Academic Search Index
Journal :
Ultramicroscopy
Publication Type :
Academic Journal
Accession number :
135957512
Full Text :
https://doi.org/10.1016/j.ultramic.2019.02.008