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Generalized Voigt broadening due to thermal fluctuations of electromechanical nanosensors and molecular electronic junctions.

Authors :
Ochoa, Maicol A.
Zwolak, Michael
Source :
Journal of Chemical Physics. 4/14/2019, Vol. 150 Issue 14, pN.PAG-N.PAG. 6p. 3 Graphs.
Publication Year :
2019

Abstract

Graphene and other 2D materials give a platform for electromechanical sensing of biomolecules in aqueous, room temperature environments. The electronic current changes in response to mechanical deflection, indicating the presence of forces due to interactions with, e.g., molecular species. We develop illustrative models of these sensors in order to give explicit, compact expressions for the current and signal-to-noise ratio. Electromechanical structures have an electron transmission function that follows a generalized Voigt profile, with thermal fluctuations giving a Gaussian smearing analogous to thermal Doppler broadening in solution/gas-phase spectroscopic applications. The Lorentzian component of the profile comes from the contact to the electrodes. After providing an accurate approximate form of this profile, we calculate the mechanical susceptibility for a representative two-level bridge and the current fluctuations for electromechanical detection. These results give the underlying mechanics of electromechanical sensing in more complex scenarios, such as graphene deflectometry. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00219606
Volume :
150
Issue :
14
Database :
Academic Search Index
Journal :
Journal of Chemical Physics
Publication Type :
Academic Journal
Accession number :
135877784
Full Text :
https://doi.org/10.1063/1.5081140