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Error-Feedback Mismatch Error Shaping for High-Resolution Data Converters.

Authors :
Liu, Jiaxin
Hsu, Chen-Kai
Tang, Xiyuan
Li, Shaolan
Wen, Guangjun
Sun, Nan
Source :
IEEE Transactions on Circuits & Systems. Part I: Regular Papers. Apr2019, Vol. 66 Issue 4, p1342-1354. 13p.
Publication Year :
2019

Abstract

Device mismatch is a key concern for high-resolution data converters. This paper presents a comprehensive study of the error-feedback (EF)-based mismatch error shaping (MES) technique. EF MES overcomes the key challenge of the classic dynamic element matching-based MES whose complexity grows exponentially with the number of bits; however, the prior EF MES comes with the limitations of limited shaping capability and reduced dynamic range. This paper demonstrates how to perform more advanced EF MES for various types of data converters. Moreover, this paper also proposes the use of digital prediction to address the dynamic range loss issue. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
15498328
Volume :
66
Issue :
4
Database :
Academic Search Index
Journal :
IEEE Transactions on Circuits & Systems. Part I: Regular Papers
Publication Type :
Periodical
Accession number :
135443080
Full Text :
https://doi.org/10.1109/TCSI.2018.2879582