Image analysis in transmission electron microscope images of amorphous carbon film.

Authors :: Oshida, Kyoichi
Kobayashi, Minoru
Furuta, Terumi
Endo, Morinobu
Oberlin, Agnes
Source :: Electronics & Communications in Japan, Part 2: Electronics. Jul98, Vol. 81 Issue 7, p64-70. 7p.
Publication Year :: 1998
Abstract: Transmission electron microscopy (TEM) is a very useful method for clarifying crystalline or amorphous structures of carbon materials. In order to discuss the contrast of TEM images, we studied the change of TEM images versus the underfocus value Δf. An amorphous carbon film with no orientation and random structure was used as a sample and was observed by TEM at different values of Δf. © 1998 Scripta Technica, Electron Comm Jpn Pt 2, 81(7): 64–70, 1998 [ABSTRACT FROM AUTHOR]

Subjects :: *IMAGE analysis
*TRANSMISSION electron microscopes
*POWER spectra
*SPECTRUM analysis
*MICROSCOPY
*OPTICS

Language :: English
ISSN :: 8756663X
Volume :: 81
Issue :: 7
Database :: Academic Search Index
Journal :: Electronics & Communications in Japan, Part 2: Electronics
Publication Type :: Academic Journal
Accession number :: 13539684
Full Text :: https://doi.org/10.1002/(SICI)1520-6432(199807)81:7<64::AID-ECJB8>3.0.CO;2-2

Full Text Access

Tools