Analysis and design of mitered H-plane bends in rectangular waveguides by combining the mode-matching and port reflection coefficient methods.

An accurate and efficient characterization method of mitered H-plane waveguide bends is developed by combining the mode-matching method and the port reflection coefficient method. In the analysis, the two-port waveguide bend is converted to a one-port structure composed of cascaded waveguide step-junctions only. The analysis and computation procedures are greatly simplified thereby. Convergence properties and reliabilities of the obtained numerical results are verified. Variations of the return loss of the mitered bend are investigated with various dimensions of the mitered part. Wide band and low return loss characteristics of the mitered bend are found with the obtained optimal compensation dimension. © 1997 Scripta Technica, Inc. Electron Comm Jpn Pt 2, 80(5): 1–7, 1997 [ABSTRACT FROM AUTHOR]