Cite
Multiple parameter dynamic photoresponse microscopy for data-intensive optoelectronic measurements of van der Waals heterostructures.
MLA
Arp, Trevor B., and Nathaniel M. Gabor. “Multiple Parameter Dynamic Photoresponse Microscopy for Data-Intensive Optoelectronic Measurements of van Der Waals Heterostructures.” Review of Scientific Instruments, vol. 90, no. 2, Feb. 2019, p. N.PAG. EBSCOhost, https://doi.org/10.1063/1.5085007.
APA
Arp, T. B., & Gabor, N. M. (2019). Multiple parameter dynamic photoresponse microscopy for data-intensive optoelectronic measurements of van der Waals heterostructures. Review of Scientific Instruments, 90(2), N.PAG. https://doi.org/10.1063/1.5085007
Chicago
Arp, Trevor B., and Nathaniel M. Gabor. 2019. “Multiple Parameter Dynamic Photoresponse Microscopy for Data-Intensive Optoelectronic Measurements of van Der Waals Heterostructures.” Review of Scientific Instruments 90 (2): N.PAG. doi:10.1063/1.5085007.