Cite
Thermal annealing effects on the structural, magnetic and hyperfine properties of the Fe/SnO2/Fe thin film deposited by RF sputtering method.
MLA
Aragón, F. F. H., et al. “Thermal Annealing Effects on the Structural, Magnetic and Hyperfine Properties of the Fe/SnO2/Fe Thin Film Deposited by RF Sputtering Method.” Materials Science in Semiconductor Processing, vol. 93, Apr. 2019, pp. 182–87. EBSCOhost, https://doi.org/10.1016/j.mssp.2019.01.004.
APA
Aragón, F. F. H., Aquino, J. C. R., Ardisson, J. D., & Coaquira, J. A. H. (2019). Thermal annealing effects on the structural, magnetic and hyperfine properties of the Fe/SnO2/Fe thin film deposited by RF sputtering method. Materials Science in Semiconductor Processing, 93, 182–187. https://doi.org/10.1016/j.mssp.2019.01.004
Chicago
Aragón, F.F.H., J.C.R. Aquino, J.D. Ardisson, and J.A.H. Coaquira. 2019. “Thermal Annealing Effects on the Structural, Magnetic and Hyperfine Properties of the Fe/SnO2/Fe Thin Film Deposited by RF Sputtering Method.” Materials Science in Semiconductor Processing 93 (April): 182–87. doi:10.1016/j.mssp.2019.01.004.