Unique buckling and post-buckling behavior of Cu–Zr amorphous films on compliant substrates.

Highlights • In situ study on the buckling and post-buckling of Cu–Zr amorphous films. • A unique buckling and post-buckling behavior is observed. • A buckling map has been developed, including four buckling modes. • Formation of buckling modes are related to the size-dependent deformation. Abstract The buckling and post-buckling behavior of the Cu–Zr amorphous films is highly dependent on film thickness (h) and applied strain (ε). A buckling map has been developed with h and ε as axes, where four buckling modes are detected, including uncracked triangular buckle, cracked rectangular buckle, cracked triangular buckle, and patches. Formation of the four buckling modes will be discussed in terms of the film thickness and size-dependent deformation. [ABSTRACT FROM AUTHOR]