The influence of surface processing on properties of CdZnTe films prepared by close-spaced sublimation.

Abstract Mechanical polishing treatment was carried out on polycrystalline CdZnTe thick films grown by close-spaced sublimation method. The influence of Al 2 O 3 polishing powder particle sizes (2.5 μm, 1 μm and 0.05 μm) and polishing durations (1 h, 2 h and 3 h) on the structure, surface morphology and electrical performances of the CdZnTe thick films was studied by XRD, EDS, SEM, AFM and I-V characterization systems. The results showed that the reduction of the particle size of the polishing powder and the appropriate increase of the polishing time length could improve the surface roughness, surface defects and leakage current of the CdZnTe sample. Highlights • High quality CdZnTe thick film was prepared by close-spaced sublimation method. • The films were polished with different Al 2 O 3 particle sizes and polishing durations. • Mechanical polishing improved surface topography and reduced the defects of films. • Low leakage current and high UV sensitivity of detectors were obtained by polishing. [ABSTRACT FROM AUTHOR]