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2pA_SS3-8Investigations of deformation twinning in sapphire by in situ TEM indentation and atomic-resolution STEM.

Authors :
Tochigi, Eita
Bin, Miao
Kondo, Shun
Nakamura, Atsutomo
Shibata, Naoya
Ikuhara, Yuichi
Source :
Microscopy. Nov2018 Supplement2, Vol. 67, pi22-i22. 1p.
Publication Year :
2018

Subjects

Subjects :
*SAPPHIRES
*SCANNING transmission electron microscopy
*SCANNING electron microscopy

Details

Language :
English
ISSN :
20505698
Volume :
67
Database :
Academic Search Index
Journal :
Microscopy
Publication Type :
Academic Journal
Accession number :
133211812
Full Text :
https://doi.org/10.1093/jmicro/dfy069
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