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Ion-induced phase transition in thin Co films

Authors :
Zhang, Kun
Gupta, R.
Lieb, K.P.
Luo, Y.
Müller, G.A.
Schaaf, P.
Uhrmacher, M.
Source :
Journal of Magnetism & Magnetic Materials. May2004, Vol. 272-276, p1162-1163. 2p.
Publication Year :
2004

Abstract

Rectangular 75 nm thick Co films were irradiated with 200 keV Xe-ions, to fluences of 2.5×1013–8×1015 ions/cm2. The film thickness and the implanted Xe profiles, the phase structure and ion-induced lattice dilations as well as the magnetic hysteresis patterns were measured. For lower fluences up to 4×1014 Xe/cm2, we found predominantly the HCP phase with an in-plane magnetization. The transition to the four-fold in-plane magnetization typical of the FCC phase occurred at a fluence range between 4×1014/cm2 and 2×1015/cm2. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
03048853
Volume :
272-276
Database :
Academic Search Index
Journal :
Journal of Magnetism & Magnetic Materials
Publication Type :
Academic Journal
Accession number :
13242870
Full Text :
https://doi.org/10.1016/j.jmmm.2003.12.020