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Ion-induced phase transition in thin Co films
- Source :
-
Journal of Magnetism & Magnetic Materials . May2004, Vol. 272-276, p1162-1163. 2p. - Publication Year :
- 2004
-
Abstract
- Rectangular 75 nm thick Co films were irradiated with 200 keV Xe-ions, to fluences of 2.5×1013–8×1015 ions/cm2. The film thickness and the implanted Xe profiles, the phase structure and ion-induced lattice dilations as well as the magnetic hysteresis patterns were measured. For lower fluences up to 4×1014 Xe/cm2, we found predominantly the HCP phase with an in-plane magnetization. The transition to the four-fold in-plane magnetization typical of the FCC phase occurred at a fluence range between 4×1014/cm2 and 2×1015/cm2. [Copyright &y& Elsevier]
- Subjects :
- *ION implantation
*FERROMAGNETISM
*MAGNETIZATION
*ELECTROMAGNETIC induction
Subjects
Details
- Language :
- English
- ISSN :
- 03048853
- Volume :
- 272-276
- Database :
- Academic Search Index
- Journal :
- Journal of Magnetism & Magnetic Materials
- Publication Type :
- Academic Journal
- Accession number :
- 13242870
- Full Text :
- https://doi.org/10.1016/j.jmmm.2003.12.020