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Hong-Ou-Mandel quantum interferometry breaks nanometer measurement barrier.
- Source :
-
Laser Focus World . Sep2018, Vol. 54 Issue 9, p25-28. 4p. - Publication Year :
- 2018
-
Abstract
- The article reports on the Hong-Ou-Mandel quantum interferometry. It mentions its potential in eliminating impediments in nanometer measurement and ameliorating multilayer sample characterization. It also notes its development from a pair of photons based on spontaneous parametric down-conversion (SPDC).
- Subjects :
- *INTERFEROMETRY
*MEASUREMENT
*PHOTONS
*MULTILAYERS
*PARAMETRIC downconversion
Subjects
Details
- Language :
- English
- ISSN :
- 10438092
- Volume :
- 54
- Issue :
- 9
- Database :
- Academic Search Index
- Journal :
- Laser Focus World
- Publication Type :
- Periodical
- Accession number :
- 131840411