Cite
Detection of Residual Oil Film on Polished KDP Crystal by Atomic Force Microscope.
MLA
Guan, Lichao, et al. “Detection of Residual Oil Film on Polished KDP Crystal by Atomic Force Microscope.” Instruments & Experimental Techniques, vol. 61, no. 4, July 2018, pp. 618–25. EBSCOhost, https://doi.org/10.1134/S0020441218040085.
APA
Guan, L., Ding, J., Zhang, Y., Li, H., Wang, C., Wang, W., Du, L., & He, J. (2018). Detection of Residual Oil Film on Polished KDP Crystal by Atomic Force Microscope. Instruments & Experimental Techniques, 61(4), 618–625. https://doi.org/10.1134/S0020441218040085
Chicago
Guan, Lichao, Jiexiong Ding, Yunpeng Zhang, Haining Li, Chao Wang, Wei Wang, Li Du, and Jianguo He. 2018. “Detection of Residual Oil Film on Polished KDP Crystal by Atomic Force Microscope.” Instruments & Experimental Techniques 61 (4): 618–25. doi:10.1134/S0020441218040085.