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An Electro-Optic Pulsed NVNA Load–Pull System for Distributed $E$ -Field Measurements.

Authors :
Urbonas, Jonas
Kim, Kevin
Vanaverbeke, Frederik
Aaen, Peter H.
Source :
IEEE Transactions on Microwave Theory & Techniques. Jun2018, Vol. 66 Issue 6, p2896-2903. 8p.
Publication Year :
2018

Abstract

In this paper, a new combined electro-optic (EO) and pulsed nonlinear vector network analyzer-based (NVNA) load–pull measurement system for distributed multiharmonic electric field ( $E$ -field) measurements is presented. The system uses an external EO probe to measure cross-frequency phase-coherent multiharmonic vector $E$ -fields with an 8- $\mu \text{m}$ spatial resolution and 20 MHz–20 GHz bandwidth. We demonstrate the performance of the distributed phase-coherent $E$ -field measurements of $E_{x}$ , $E_{y}$ , and $E_{z}$ components with three harmonics above a commercially available large periphery, packaged, laterally diffused metal-oxide-semiconductor transistor. The transistor was measured at 2.2 GHz under pulsed conditions with 10- $\mu \text{s}$ pulse and 10% duty cycle, while outputting 55.1 dBm of power. The measured $E$ -fields of the operating transistor are animated for the first time and reveal complex nonuniform operation at harmonic frequencies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00189480
Volume :
66
Issue :
6
Database :
Academic Search Index
Journal :
IEEE Transactions on Microwave Theory & Techniques
Publication Type :
Academic Journal
Accession number :
130018016
Full Text :
https://doi.org/10.1109/TMTT.2018.2816930