Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators.

MLA

McRae, C. R. H., et al. “Thin Film Metrology and Microwave Loss Characterization of Indium and Aluminum/Indium Superconducting Planar Resonators.” Journal of Applied Physics, vol. 123, no. 20, May 2018, p. N.PAG. EBSCOhost, https://doi.org/10.1063/1.5020514.

APA

McRae, C. R. H., Béjanin, J. H., Earnest, C. T., McConkey, T. G., Rinehart, J. R., Deimert, C., Thomas, J. P., Wasilewski, Z. R., & Mariantoni, M. (2018). Thin film metrology and microwave loss characterization of indium and aluminum/indium superconducting planar resonators. Journal of Applied Physics, 123(20), N.PAG. https://doi.org/10.1063/1.5020514

Chicago

McRae, C. R. H., J. H. Béjanin, C. T. Earnest, T. G. McConkey, J. R. Rinehart, C. Deimert, J. P. Thomas, Z. R. Wasilewski, and M. Mariantoni. 2018. “Thin Film Metrology and Microwave Loss Characterization of Indium and Aluminum/Indium Superconducting Planar Resonators.” Journal of Applied Physics 123 (20): N.PAG. doi:10.1063/1.5020514.