S3 targets monitoring with an electron gun.

Authors :: Kallunkathariyil, J.
Stodel, Ch.
Marry, C.
Frémont, G.
Bastin, B.
Piot, J.
Clément, E.
Le Moal, S.
Morel, V.
Thomas, J.-C.
Kamalou, O.
Spitaëls, C.
Savajols, H.
Vostinar, M.
Pellemoine, F.
Mittig, W.
Kheswa, Ntombizonke
Greene, John
Source :: AIP Conference Proceedings. 2018, Vol. 1962 Issue 1, pN.PAG-N.PAG. 9p. 2 Color Photographs, 1 Black and White Photograph, 1 Diagram, 2 Charts, 3 Graphs.
Publication Year :: 2018
Abstract: The monitoring of targets under irradiation was investigated using a 20 keV electron beam. An integrated and automated electron beam deflection was developed allowing a monitoring over the whole surface of target materials. Thus, local defects could be identified on-line during an experiment performed at GANIL involving different materials irradiated with a focused krypton beam at 10.5 MeV/u. Performances of this target monitoring system are presented in this paper. [ABSTRACT FROM AUTHOR]