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Residual lifetime prediction model of nonlinear accelerated degradation data with measurement error.

Authors :
Zhongyi Cai
Yunxiang Chen
Qiang Zhang
Huachun Xiang
Source :
Journal of Systems Engineering & Electronics. Oct2017, Vol. 28 Issue 5, p1028-1038. 11p.
Publication Year :
2017

Abstract

For the product degradation process with random effect (RE), measurement error (ME) and nonlinearity in step-stress accelerated degradation test (SSADT), the nonlinear Wiener based degradation model with RE and ME is built. An analytical approximation to the probability density function (PDF) of the product's lifetime is derived in a closed form. The process and data of SSADT are analyzed to obtain the relation model of the observed data under each accelerated stress. The likelihood function for the population-based observed data is constructed. The populationbased model parameters and its random coefficient prior values are estimated. According to the newly observed data of the target product in SSADT, an analytical approximation to the PDF of its residual lifetime (RL) is derived in accordance with its individual degradation characteristics. The parameter updating method based on Bayesian inference is applied to obtain the posterior value of random coefficient of the RL model. A numerical example by simulation is analyzed to verify the accuracy and advantage of the proposed model. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
10044132
Volume :
28
Issue :
5
Database :
Academic Search Index
Journal :
Journal of Systems Engineering & Electronics
Publication Type :
Periodical
Accession number :
128438536
Full Text :
https://doi.org/10.21629/JSEE.2017.05.21