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Design myths surround strained SOI.

Authors :
Pelloie, Jean-Luc
Source :
Electronic Engineering Times (01921541). 4/12/2004, Issue 1316, p39-39. 1/2p.
Publication Year :
2004

Abstract

Comments on the misperception on strained silicon and strained silicon-on-insulator. Ease of deploying strained silicon as a substrate material for highly advanced integrated circuits; Prevention of the short-channel effect by the thickness of the silicon film; Reduction of threshold voltage by shrinking the transistor gate length.

Details

Language :
English
ISSN :
01921541
Issue :
1316
Database :
Academic Search Index
Journal :
Electronic Engineering Times (01921541)
Publication Type :
Periodical
Accession number :
12813032