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QUALITY AND RELIABILITY ASSESSMENT OF HARDWARE AND SOFTWARE DURING THE TOTAL PRODUCT LIFE CYCLE.

Authors :
Jones, David R.
Murthy, Vyasaraj
Blanchard, Jeffrey
Source :
Quality & Reliability Engineering International. Sep/Oct92, Vol. 8 Issue 5, p477-483. 7p.
Publication Year :
1992

Abstract

A major challenge for the computer industry is the need for the development and implementation of an engineering language which provides continuous linkages and measurement between the customer and all engineering functions internal to the company. Such a language would allow information solution developers and information service providers to be able to continuously monitor the quality and reliability performance of integrated hardware and software products during the complete product life cycle. A quantitative engineering language needs to be developed to provide seamless and continuous linkages between the customer-the user of integrated computer systems-and all of the engineering development and manufacturing functions tasked with designing and building solutions which meet customer needs. A methodology is proposed which addresses this challenge by the implementation of two metrics: total defects per unit (TDU) and the annual rate of events (ARE). These two metrics can measure all hardware, software and computer integration events during the total product life cycle. A methodology is presented which provides a rigorous translation of the ARE metric, monitored at the customer site, into the traditional reliability metrics used by engineering and manufacturing. Algorithms are presented which directly translate AREs into mean time between failures (MTBF), mean time between parts replacement (MTBPR) and mean time between system interruptions (MTBSI). The ARE metric meets the customer requirement of being able to clearly focus on the reliability and availability performance of total systems as a result of hardware and software components, the user interface, and environmental factors. The paper discusses the development and application of integrated TDU and ARE metrics and shows how the total product life cycle quality and reliability of a complex integrated computer and communications solution can be efficiently monitored and managed for improvement during design, manufacturing, and installation performance in an integrated customer environment. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
07488017
Volume :
8
Issue :
5
Database :
Academic Search Index
Journal :
Quality & Reliability Engineering International
Publication Type :
Academic Journal
Accession number :
12804751
Full Text :
https://doi.org/10.1002/qre.4680080511