On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs.

MLA

Libano, F., et al. “On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs.” IEEE Transactions on Nuclear Science, vol. 65, no. 1, Jan. 2018, pp. 288–95. EBSCOhost, https://doi.org/10.1109/TNS.2017.2784367.

APA

Libano, F., Rech, P., Tambara, L., Tonfat, J., & Kastensmidt, F. (2018). On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs. IEEE Transactions on Nuclear Science, 65(1), 288–295. https://doi.org/10.1109/TNS.2017.2784367

Chicago

Libano, F., P. Rech, L. Tambara, J. Tonfat, and F. Kastensmidt. 2018. “On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs.” IEEE Transactions on Nuclear Science 65 (1): 288–95. doi:10.1109/TNS.2017.2784367.