Cite
A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation.
MLA
Francis, Laurent A., et al. “A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation.” EPJ Web of Conferences, vol. 170, Feb. 2018, pp. 1–4. EBSCOhost, https://doi.org/10.1051/epjconf/201817001006.
APA
Francis, L. A., Sedki, A., André, N., Kilchytska, V., Gérard, P., Ali, Z., Udrea, F., & Flandre, D. (2018). A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation. EPJ Web of Conferences, 170, 1–4. https://doi.org/10.1051/epjconf/201817001006
Chicago
Francis, Laurent A., Amor Sedki, Nicolas André, Valéria Kilchytska, Pierre Gérard, Zeeshan Ali, Florin Udrea, and Denis Flandre. 2018. “A Low-Power and In Situ Annealing Technique for the Recovery of Active Devices After Proton Irradiation.” EPJ Web of Conferences 170 (February): 1–4. doi:10.1051/epjconf/201817001006.