Back to Search
Start Over
Fine electron biprism on a Si-on-insulator chip for off-axis electron holography.
- Source :
-
Ultramicroscopy . Feb2018, Vol. 185, p81-89. 9p. - Publication Year :
- 2018
-
Abstract
- Off-axis electron holography allows both the amplitude and the phase shift of an electron wavefield propagating through a specimen in a transmission electron microscope to be recovered. The technique requires the use of an electron biprism to deflect an object wave and a reference wave to form an interference pattern. Here, we introduce an approach based on semiconductor processing technology to fabricate fine electron biprisms with rectangular cross-sections. By performing electrostatic calculations and preliminary experiments, we demonstrate that such biprisms promise improved performance for electron holography experiments. [ABSTRACT FROM AUTHOR]
- Subjects :
- *ELECTRON holography
*ELECTRIC potential
*ELECTRON beams
*ELECTRONS
*MAGNETIC fields
Subjects
Details
- Language :
- English
- ISSN :
- 03043991
- Volume :
- 185
- Database :
- Academic Search Index
- Journal :
- Ultramicroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 127137783
- Full Text :
- https://doi.org/10.1016/j.ultramic.2017.11.012