Measurement of linewidth enhancement factor in self-assembled quantum dot semiconductor lasers emitting at 1310 nm.

MLA

Muszalski, J., et al. “Measurement of Linewidth Enhancement Factor in Self-Assembled Quantum Dot Semiconductor Lasers Emitting at 1310 Nm.” Electronics Letters (Institution of Engineering & Technology), vol. 40, no. 7, Apr. 2004, pp. 428–30. EBSCOhost, https://doi.org/10.1049/el:20040270.

APA

Muszalski, J., Houlihan, J., Huyet, G., & Corbett, B. (2004). Measurement of linewidth enhancement factor in self-assembled quantum dot semiconductor lasers emitting at 1310 nm. Electronics Letters (Institution of Engineering & Technology), 40(7), 428–430. https://doi.org/10.1049/el:20040270

Chicago

Muszalski, J., J. Houlihan, G. Huyet, and B. Corbett. 2004. “Measurement of Linewidth Enhancement Factor in Self-Assembled Quantum Dot Semiconductor Lasers Emitting at 1310 Nm.” Electronics Letters (Institution of Engineering & Technology) 40 (7): 428–30. doi:10.1049/el:20040270.