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Focusing X-ray free-electron laser pulses using Kirkpatrick--Baez mirrors at the NCI hutch of the PAL-XFEL.

Authors :
Kim, Jangwoo
Kim, Hyo-Yun
Park, Jaehyun
Kim, Sangsoo
Kim, Sunam
Rah, Seungyu
Lim, Jun
Nam, Ki Hyun
Source :
Journal of Synchrotron Radiation. Jan2018, Vol. 25 Issue 1, p1-292. 4p.
Publication Year :
2018

Abstract

The Pohang Accelerator Laboratory X-ray Free-Electron Laser (PAL-XFEL) is a recently commissioned X-ray free-electron laser (XFEL) facility that provides intense ultrashort X-ray pulses based on the self-amplified spontaneous emission process. The nano-crystallography and coherent imaging (NCI) hutch with forward-scattering geometry is located at the hard X-ray beamline of the PAL-XFEL and provides opportunities to perform serial femtosecond crystallography and coherent X-ray diffraction imaging. To produce intense highdensity XFEL pulses at the interaction positions between the X-rays and various samples, a microfocusing Kirkpatrick--Baez (KB) mirror system that includes an ultra-precision manipulator has been developed. In this paper, the design of a KB mirror system that focuses the hard XFEL beam onto a fixed sample point of the NCI hutch, which is positioned along the hard XFEL beamline, is described. The focusing system produces a two-dimensional focusing beam at approximately 2 mm scale across the 2-11 keV photon energy range. XFEL pulses of 9.7 keVenergy were successfully focused onto an area of size 1.94 mm x 2.08 mm FWHM. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
09090495
Volume :
25
Issue :
1
Database :
Academic Search Index
Journal :
Journal of Synchrotron Radiation
Publication Type :
Academic Journal
Accession number :
127009605
Full Text :
https://doi.org/10.1107/S1600577517016186