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Thermal Resistance Analysis by Induced Transient (TRAIT) Method for Power Electronic Devices...

Authors :
Bagnoli, Paolo Emilio
Casarosa, Claudio
Source :
IEEE Transactions on Power Electronics. Nov98, Vol. 13 Issue 6, p1220. 9p.
Publication Year :
1998

Abstract

PART II. Presents a study which focused on thermal characterization of electronic devices. Methods and materials used in the study; Description of the thermal resistance analysis by induced transient (TRAIT) method; Results of the study; Conclusions of the study.

Subjects

Subjects :
*THERMAL analysis
*ELECTRONICS

Details

Language :
English
ISSN :
08858993
Volume :
13
Issue :
6
Database :
Academic Search Index
Journal :
IEEE Transactions on Power Electronics
Publication Type :
Academic Journal
Accession number :
1269907
Full Text :
https://doi.org/10.1109/63.728349
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