Cite
A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm.
MLA
Duan, Yan, et al. “A Low-Cost Dithering Method for Improving ADC Linearity Test Applied in USMILE Algorithm.” Journal of Electronic Testing, vol. 33, no. 6, Dec. 2017, pp. 709–20. EBSCOhost, https://doi.org/10.1007/s10836-017-5696-3.
APA
Duan, Y., Chen, T., & Chen, D. (2017). A Low-cost Dithering Method for Improving ADC Linearity Test Applied in uSMILE Algorithm. Journal of Electronic Testing, 33(6), 709–720. https://doi.org/10.1007/s10836-017-5696-3
Chicago
Duan, Yan, Tao Chen, and Degang Chen. 2017. “A Low-Cost Dithering Method for Improving ADC Linearity Test Applied in USMILE Algorithm.” Journal of Electronic Testing 33 (6): 709–20. doi:10.1007/s10836-017-5696-3.