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Second-order optical nonlinearity and change in refractive index in silica glasses by a combination of thermal poling and x-ray irradiation.
- Source :
-
Journal of Applied Physics . 4/15/2004, Vol. 95 Issue 8, p4000-4006. 7p. 7 Graphs. - Publication Year :
- 2004
-
Abstract
- Second-order optical nonlinearity was found to be generated in high-purity silica glasses when they were exposed to x-ray radiation and then thermally poled. Two kinds of second-order optical nonlinearity, near-surface nonlinearity localized in a thin layer near the sample surface and bulk nonlinearity spreading throughout the whole sample, were observed. The maximum χ33(2) values of near-surface and bulk nonlinearity were 0.20 and 0.43 pm/V, respectively. Further, a change in refractive index of Δn=4×10-3 was also observed in the sample. The χ33(2) value of the bulk nonlinearity and the change in refractive index increased with the x-ray intensity. On the other hand, the χ33(2) value of the near-surface nonlinearity had a tendency to saturate when the intensity was higher than 1.3 mW/cm2. Based on absorption spectra of the samples, both the bulk nonlinearity and the refractive index change were found to be associated with point defects such as the E′ center (=Si·) and nonbridging oxygen ions (NBO-,=Si–O-). © 2004 American Institute of Physics. [ABSTRACT FROM AUTHOR]
- Subjects :
- *SILICA
*REFRACTIVE index
*IRRADIATION
*X-rays
*EXCITON theory
*ABSORPTION spectra
Subjects
Details
- Language :
- English
- ISSN :
- 00218979
- Volume :
- 95
- Issue :
- 8
- Database :
- Academic Search Index
- Journal :
- Journal of Applied Physics
- Publication Type :
- Academic Journal
- Accession number :
- 12687853
- Full Text :
- https://doi.org/10.1063/1.1652239