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Single atom imaging with an sCMOS camera.

Authors :
Picken, C. J.
Legaie, R.
Pritchard, J. D.
Source :
Applied Physics Letters. 10/16/2017, Vol. 111 Issue 16, p164102-1-164102-5. 5p. 1 Color Photograph, 2 Charts, 3 Graphs.
Publication Year :
2017

Abstract

Single atom imaging requires discrimination of weak photon count events above the background and has typically been performed using electron-multiplying charge-coupled device cameras, photomultiplier tubes, or single photon counting modules. A scientific complementary metal-oxide semiconductor (sCMOS) provides a cost effective and highly scalable alternative to other single atom imaging technologies, offering fast readout and larger sensor dimensions. We demonstrate single atom resolved imaging of two site-addressable optical traps separated by 10 μm using an sCMOS camera, offering a competitive signal-to-noise ratio at intermediate count rates to allow high fidelity readout discrimination (error<10-6) and sub-μm spatial resolution for applications in quantum technologies. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00036951
Volume :
111
Issue :
16
Database :
Academic Search Index
Journal :
Applied Physics Letters
Publication Type :
Academic Journal
Accession number :
125810247
Full Text :
https://doi.org/10.1063/1.5003304