Cite
Visualization and automatic detection of defect distribution in GaN atomic structure from sampling Moiré phase.
MLA
Q H Wang, et al. “Visualization and Automatic Detection of Defect Distribution in GaN Atomic Structure from Sampling Moiré Phase.” Nanotechnology, vol. 28, no. 45, Nov. 2017, p. 1. EBSCOhost, https://doi.org/10.1088/1361-6528/aa8d83.
APA
Q H Wang, S Ri, H Tsuda, M Kodera, K Suguro, & N Miyashita. (2017). Visualization and automatic detection of defect distribution in GaN atomic structure from sampling Moiré phase. Nanotechnology, 28(45), 1. https://doi.org/10.1088/1361-6528/aa8d83
Chicago
Q H Wang, S Ri, H Tsuda, M Kodera, K Suguro, and N Miyashita. 2017. “Visualization and Automatic Detection of Defect Distribution in GaN Atomic Structure from Sampling Moiré Phase.” Nanotechnology 28 (45): 1. doi:10.1088/1361-6528/aa8d83.