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Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.
- Source :
-
Microelectronics Reliability . Sep2017, Vol. 76, p650-654. 5p. - Publication Year :
- 2017
-
Abstract
- This paper presents a methodology for analysing two-photon absorption laser testing results in the frequency domain rather than with the classical mapping approach. We experimentally demonstrate, on a 28 nm device, the extraction of subwavelength dimensions from a noisy environment without requiring any synchronization between the test operations and the laser or the scan motion. A model of the experiment is then used to evaluate the impact of different parameters on the capabilities of the technique. [ABSTRACT FROM AUTHOR]
Details
- Language :
- English
- ISSN :
- 00262714
- Volume :
- 76
- Database :
- Academic Search Index
- Journal :
- Microelectronics Reliability
- Publication Type :
- Academic Journal
- Accession number :
- 125255542
- Full Text :
- https://doi.org/10.1016/j.microrel.2017.07.028