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Structural pattern extraction from asynchronous two-photon laser fault injection using spectral analysis.

Authors :
Pouget, V.
Jonathas, S.
Job, R.
Vaillé, J.R.
Wrobel, F.
Saigné, F.
Source :
Microelectronics Reliability. Sep2017, Vol. 76, p650-654. 5p.
Publication Year :
2017

Abstract

This paper presents a methodology for analysing two-photon absorption laser testing results in the frequency domain rather than with the classical mapping approach. We experimentally demonstrate, on a 28 nm device, the extraction of subwavelength dimensions from a noisy environment without requiring any synchronization between the test operations and the laser or the scan motion. A model of the experiment is then used to evaluate the impact of different parameters on the capabilities of the technique. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
00262714
Volume :
76
Database :
Academic Search Index
Journal :
Microelectronics Reliability
Publication Type :
Academic Journal
Accession number :
125255542
Full Text :
https://doi.org/10.1016/j.microrel.2017.07.028