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Operation and design of metal-oxide tunnel transistors.

Authors :
Rendell, R.W.
Buot, F.A.
Source :
Journal of Applied Physics. 11/1/1998, Vol. 84 Issue 9, p5021. 11p.
Publication Year :
1998

Abstract

Examines the calculation of the current-voltage (I-V) characteristics within the ballistic limit involving the metal-oxide tunnel transistors (MOTT). What the gate transconductance improves; Discussion on the saturation (knee) point and three modes of current transport across the device; How the low-voltage current saturation for MOTT is obtained.

Details

Language :
English
ISSN :
00218979
Volume :
84
Issue :
9
Database :
Academic Search Index
Journal :
Journal of Applied Physics
Publication Type :
Academic Journal
Accession number :
1243926
Full Text :
https://doi.org/10.1063/1.368749