Effects of Cell-Driving Jitters on the Output Voltage of Magnetically Insulated Induction Voltage Adders.

Based on a 12-cell transmission line code model, the effects of cell-driving jitters on the output voltage (both the rise time and the flat-top waveform) of magnetically insulated induction voltage adders (MIVAs) were analyzed in detail. Simulation results show that the rise time (0.1–0.9) of the MIVA output voltage is a function of $\sigma $ (the standard deviation of the cell-driving jitters) when N (the number of cells connected in series for an MIVA) is small. When cell-driving jitters follow a normal probability distribution, the rise time of the output voltages also accord well with normal distributions. Parameters of these distributions are analytically deduced and presented. For any experimental shot, there is a fiducial probability that the rise time falls into the analytic solution range (within a certain error range). With the same error range, the fiducial probability decreases as $\sigma $ increases, while probabilities that the rise time are higher or lower than this range increase synchronously. Simulation results also indicate that cell-driving jitters have fewer effects on the flat-top peak of the MIVA output voltage. However, a series of ripple voltages is added on the flat-top waveform, and the average peak of these ripple voltages increases as $\sigma $ increases. [ABSTRACT FROM PUBLISHER]