Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits.

MLA

Dunsworth, A., et al. “Characterization and Reduction of Capacitive Loss Induced by Sub-Micron Josephson Junction Fabrication in Superconducting Qubits.” Applied Physics Letters, vol. 111, no. 2, July 2017, pp. 1–4. EBSCOhost, https://doi.org/10.1063/1.4993577.

APA

Dunsworth, A., Megrant, A., Quintana, C., Zijun Chen, Barends, R., Burkett, B., Foxen, B., Yu Chen, Chiaro, B., Fowler, A., Graff, R., Jeffrey, E., Kelly, J., Lucero, E., Mutus, J. Y., Neeley, M., Neill, C., Roushan, P., Sank, D., & Vainsencher, A. (2017). Characterization and reduction of capacitive loss induced by sub-micron Josephson junction fabrication in superconducting qubits. Applied Physics Letters, 111(2), 1–4. https://doi.org/10.1063/1.4993577

Chicago

Dunsworth, A., A. Megrant, C. Quintana, Zijun Chen, R. Barends, B. Burkett, B. Foxen, et al. 2017. “Characterization and Reduction of Capacitive Loss Induced by Sub-Micron Josephson Junction Fabrication in Superconducting Qubits.” Applied Physics Letters 111 (2): 1–4. doi:10.1063/1.4993577.