AN INVESTIGATION ON STRUCTURAL AND ELECTRICAL PROPERTIES OF CLOSE-SPACED SUBLIMATION GROWN CdTe THIN FILMS IN DIFFERENT GROWTH CONDITIONS.

CdTe is considered as one of the most auspicious materials as absorber layer for fabricating thin film solar cells with highest efficiency of 22.1% at present reported by First Solar Inc. Growth conditions and parameters are crucial aspects to acquire high quality and pin hole free thin absorber layer. In this study, a comparative analysis has been executed for close-spaced sublimation (CSS) grown CdTe thin films in both dynamic and static conditions. These growth conditions may have dependence on the way of inert gas flow during deposition. Deposited films have been characterized by using XRD, FESEM, AFM and Hall Effect Measurement. The XRD pattern reveals the presence of zinc-blende cubic structure with ideal orientation (111) confirming polycrystalline nature. The FESEM characterization illustrates the films that are homogenous, uniform and have less crystal defects. AFM analysis has been carried out to know the surface topography and roughness which has the increasing trend for thicker films. Moreover, the electrical parameters such as carrier concentration, mobility, resistivity, and conductivity have been measured from Hall Effect measurement. [ABSTRACT FROM AUTHOR]