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Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Robert Sinclair and Nestor J. Zaluzec on the occasion of their 70th and 65th birthdays.
- Source :
-
Ultramicroscopy . May2017, Vol. 176, p1-1. 1p. - Publication Year :
- 2017
- Subjects :
- *ELECTRON microscopy
*ELECTRON optics
*ELECTRON spectroscopy
Subjects
Details
- Language :
- English
- ISSN :
- 03043991
- Volume :
- 176
- Database :
- Academic Search Index
- Journal :
- Ultramicroscopy
- Publication Type :
- Academic Journal
- Accession number :
- 122454868
- Full Text :
- https://doi.org/10.1016/j.ultramic.2016.12.004