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Gateless AlGaN/GaN HEMT response to block co-polymers

Authors :
Kang, B.S.
Louche, G.
Duran, R.S.
Gnanou, Y.
Pearton, S.J.
Ren, F.
Source :
Solid-State Electronics. May2004, Vol. 48 Issue 5, p851. 4p.
Publication Year :
2004

Abstract

Gateless AlGaN/GaN high electron mobility transistor (HEMT) structures exhibit large changes in source-drain current upon exposing the gate region to various block co-polymer solutions. The polar nature of some of these polymer chains lead to a change of surface charges in gate region on the HEMT, producing a change in surface potential at the semiconductor/liquid interface. The nitride sensors appear to be promising for a wide range of chemical gas, combustion gas, liquid and strain sensing. [Copyright &y& Elsevier]

Details

Language :
English
ISSN :
00381101
Volume :
48
Issue :
5
Database :
Academic Search Index
Journal :
Solid-State Electronics
Publication Type :
Academic Journal
Accession number :
12234324
Full Text :
https://doi.org/10.1016/j.sse.2003.10.002