Total-Ionizing-Dose Effects in Piezoresistive Micromachined Cantilevers.

MLA

Gong, Huiqi, et al. “Total-Ionizing-Dose Effects in Piezoresistive Micromachined Cantilevers.” IEEE Transactions on Nuclear Science, vol. 64, no. 1, part 1, Jan. 2017, pp. 263–68. EBSCOhost, https://doi.org/10.1109/TNS.2016.2631458.

APA

Gong, H., Liao, W., Zhang, E. X., Sternberg, A. L., McCurdy, M. W., Davidson, J. L., Reed, R. A., Fleetwood, D. M., Schrimpf, R. D., Shuvra, P. D., Lin, J.-T., McNamara, S., Walsh, K. M., Alphenaar, B. W., & Alles, M. L. (2017). Total-Ionizing-Dose Effects in Piezoresistive Micromachined Cantilevers. IEEE Transactions on Nuclear Science, 64(1, part 1), 263–268. https://doi.org/10.1109/TNS.2016.2631458

Chicago

Gong, Huiqi, Wenjun Liao, En Xia Zhang, Andrew L. Sternberg, Michael W. McCurdy, Jim L. Davidson, Robert A. Reed, et al. 2017. “Total-Ionizing-Dose Effects in Piezoresistive Micromachined Cantilevers.” IEEE Transactions on Nuclear Science 64 (1, part 1): 263–68. doi:10.1109/TNS.2016.2631458.