Non-contact temperature field measurement of solids by infrared multispectral thermotransmittance.

This work aims to achieve contactless absolute-temperature measurements of infrared-semi-transparent solids using an infrared thermal and spectroscopic imaging technique. The multispectral thermotransmittance coefficient fields in the 3-5 lm wavelength range for Sapphire, KBr, and Silicon are determined to be 6x10-4 K-1, 4x10-4 K-1, and -3x10-3 K-1, respectively. The most interesting result is the high temperature-dependent transmittance coefficient in the middle wave infrared region. With these coefficients, the absolute temperature fields in a range from room temperature to 140°C are shown. [ABSTRACT FROM AUTHOR]