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Electrical transport in nanothick ZrTe5 sheets: From three to two dimensions.

Authors :
Jingjing Niu
Jingyue Wang
Zhijie He
Chenglong Zhang
Xinqi Li
Tuocheng Cai
Xiumei Ma
Shuang Jia
Dapeng Yu
Xiaosong Wu
Source :
Physical Review B. Jan2017, Vol. 95 Issue 3, p1-1. 1p.
Publication Year :
2017

Abstract

ZrTe5 is a newly discovered topological material. Shortly after a single layer ZrTe5 had been predicted to be a two-dimensional topological insulator, a handful of experiments have been carried out on bulk ZrTe5 crystals, which however suggest that its bulk form may be a three-dimensional topological Dirac semimetal. We report a transport study on ultrathin ZrTe5 flakes down to 10 nm. A significant modulation of the characteristic resistivity maximum in the temperature dependence by thickness has been observed. Remarkably, the metallic behavior, occurring only below about 150 K in bulk, persists to over 320 K for flakes less than 20 nm thick. Furthermore, the resistivity maximum can be greatly tuned by ionic gating. Combined with the Hall resistance, we identify contributions from a semiconducting and a semimetallic band. The enhancement of the metallic state in thin flakes are a consequence of shifting of the energy bands. Our results suggest that the band structure sensitively depends on the film thickness, which may explain the divergent experimental observations on bulk materials. [ABSTRACT FROM AUTHOR]

Details

Language :
English
ISSN :
24699950
Volume :
95
Issue :
3
Database :
Academic Search Index
Journal :
Physical Review B
Publication Type :
Academic Journal
Accession number :
121180551
Full Text :
https://doi.org/10.1103/PhysRevB.95.035420