Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging.

MLA

Holloway, Christopher L., et al. “Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging.” IEEE Transactions on Electromagnetic Compatibility, vol. 59, no. 2, Part 2, Apr. 2017, pp. 717–28. EBSCOhost, https://doi.org/10.1109/TEMC.2016.2644616.

APA

Holloway, C. L., Simons, M. T., Gordon, J. A., Wilson, P. F., Cooke, C. M., Anderson, D. A., & Raithel, G. (2017). Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging. IEEE Transactions on Electromagnetic Compatibility, 59(2, Part 2), 717–728. https://doi.org/10.1109/TEMC.2016.2644616

Chicago

Holloway, Christopher L., Matthew T. Simons, Joshua A. Gordon, Perry F. Wilson, Caitlyn M. Cooke, David A. Anderson, and Georg Raithel. 2017. “Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging.” IEEE Transactions on Electromagnetic Compatibility 59 (2, Part 2): 717–28. doi:10.1109/TEMC.2016.2644616.