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Scanning electron microscope - a powerful yet economic benchtop version from Nikon and JEOL.
- Source :
-
infocus Magazine . Dec2016, Issue 44, p115-115. 1/2p. - Publication Year :
- 2016
-
Abstract
- The article offers brief information on the JCM-600CPlus NeoScope from the optical inspection and mechanical 3D metrology solutions provider Nikon Metrology Inc.
- Subjects :
- *SCANNING electron microscopes
*EVALUATION
Subjects
Details
- Language :
- English
- ISSN :
- 17504740
- Issue :
- 44
- Database :
- Academic Search Index
- Journal :
- infocus Magazine
- Publication Type :
- Academic Journal
- Accession number :
- 121021065