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A full life-cycle view of automotive test.

Authors :
Pateras, Stephen
Source :
EE: Evaluation Engineering. Jan2017, Vol. 56 Issue 1, p20-22. 3p.
Publication Year :
2017

Abstract

The article offers the author's insights on the importance of automobile testing to ensure the quality and reliability of cars. The author discusses the emerging trends of integrating semiconductor devices including smartphones in automobiles, the battery size, and the safety features of the automobile.

Details

Language :
English
ISSN :
01490370
Volume :
56
Issue :
1
Database :
Academic Search Index
Journal :
EE: Evaluation Engineering
Publication Type :
Periodical
Accession number :
120540150